Large Size P-type Silicon Microchannel Plates Prepared by Photo-Electrochemical Etching 由光辅助电化学刻蚀制备大面积p型硅微通道板
Degradation of Metal-Induced Laterally Crystallized p-Type Polycrystalline Silicon Thin Film Transistors under DC Bias Stress p型金属诱导横向结晶多晶硅TFT直流应力下的退化研究
The smallest unit that supports electron flow in a semiconductor material; a hole in P-type silicon or a free electron in N-type silicon. 在半导体材料中维持电流的最小单元,在P型硅中是空穴,在N型硅中是自由电子。
Experimental Research of Influence on Interelectrode Resistance of P-type Silicon with Different Conduction Mode 进电方式对P型硅极间电阻影响的试验研究
Positron-lifetime and infrared absorption spectra measurement is made on neutron-irradiated CZ p-type silicon wafers in the temperature range 90K to 300K. It is found that the defects in silicon created by neutron irradiation are divacancies and vacancy oxygen complexes. 在90~300K温区范围内测试了中子辐照直拉硅单晶的正电子寿命谱及红外光谱,发现直拉硅单晶的中子辐照缺陷主要是双空位和氧-空位复合体。
Study on the lifetime improvement of p-type high-resistance silicon single crystal materials P型高阻硅单晶材料的寿命初探
I-V characteristics of p-type Silicon electrode in HF solutions with different concentrations and electrochemical potential transients under galvanostatic condition, which accurately reflect the early-stage nucleation process of PS, were monitored by the electrochemical workstation ( CHI660A). 采用电化学工作站(CHI660A)监测p型硅电极在不同浓度HF溶液中的电流-电压特性,记录恒电流情况下硅电极的电压变化。这些曲线可从精确反映多孔硅形成的早期成核过程。
An Investigation on the Process of Laser Induced Electrodeposition of Copper on p-type Silicon 铜在p-Si上激光诱导电沉积过程的研究
Photoelectric conversion in PN junction of high-pure P-type silicon 高阻P型硅PN结中的光电转换
High Conductive p-type Microcrystalline Silicon with High Crystallinity Prepared by High-pressure RF-PECVD 采用高压RF-PECVD法制备高电导、高晶化率的p型微晶硅材料
Transition line series of both boron acceptor and phosphorus donor in p-type high-purity silicon have been observed simultaneously with the excitation of intrinsic light. 施加本征激发光后在P型高纯Si中同时观察到B受主和P施主的跃迁谱线系。
Laser is used as active light source for the first time in photoeleotrochemioal image deposition on P-type silicon substrate, and pictures with clear structures are obtained. 本文首次用激光作激励光源,在P型硅片上成功地进行了光电化学成像沉积,得到层次清晰的图像。
Experimental results show that p-type silicon crystals with phosphorus impurity compensation higher than 7% are susceptible to inversion by pulsed laser irradiation when the amount of impurity compensation increases and the distribution of impurity compensation changes. 实验结果表明:脉冲激光辐照之后补偿杂质浓度增加,补偿杂质磷分布发生变化,杂质补偿度大于7%的样品在被激光辐照的区域较容易转变为n型导电。
Nitrogen doped fluorinated diamond-like carbon ( FN-DLC) films were deposited on p-type silicon wafers under different deposition conditions. 不同条件下,在单晶硅基片上沉积了含氮氟化类金刚石(FN-DLC)薄膜。
P-type Silicon crystal plates have been adopted in the paper. Then the electrochemical etching experiments are done in three electrodes electrobath. 本文采用P型单晶硅片,在三极电解槽中,进行了电化学深刻蚀的探索性实验。
Laser-Induced Selective Deposition of Nickel on p-Type Silicon p型硅片上激光诱导局部化学沉镍
This paper studies the properties of the mechanical deformation of N-type and P-type monocrystal silicon under external load. 本文的目的在于研究n型和p型硅单晶材料在外荷载作用下的变形性质。
Preparation of Nickel Phosphorous Amorphous Film Catalyst by Electrodeposition on p-type Silicon p-Si上电沉积制备镍-磷非晶薄膜催化剂
The results about highly-crystallized, highly-conductive p-type microcrystalline silicon(μ c-Si: H) prepared by high-pressure RF-PECVD are reported in this paper. 本文报道了采用高压射频等离子体增强化学气相沉积(RF-PECVD)方法制备高电导、高晶化率的p型微晶硅材料的结果。
Microstructural analysis of 1-D photonic crystal based on p-type porous silicon 基于p型多孔硅的一维光子晶体的微结构分析
The fabrication and characteristics of ultra-high purity p-type silicon detector at room temperature 超纯P型硅探测器的制备和室温特性
The hyperfine interaction between nucleons and holes of silicon, and the nuclear magnetic relaxation in the p-type silicon 硅中空穴与核的超精细作用及p型硅的核磁弛豫
The temperature dependence of hole capture cross section of gold in p-type silicon was studied by capacitance transient technique. 我们用电容瞬态技术研究了P型硅中金的空穴俘获截面与温度的关系。
Behavior of gold in the Si/ SiO2 interface region has been investigated using deep level transient spectroscopy ( DLTS) in the MOS structures made on p-type silicon wafers with < 111> orientation. 用深能级瞬态谱(DLTS)技术详细研究了金在p型<111>晶向硅MOS结构Si/SiO2界面区中的行为。
Increase in catalyst concentration or silicon dioxide replacing P-type silicon as substrate could lead to denser SWNTs, shorter SWNTs and decrease in erect SWNTs on surface. 研究表明,催化剂浓度升高或采用二氧化硅替代P型硅为生长基底时,都会导致单壁碳纳米管生长的密度加大,而碳纳米管长度变短且更易贴附基底表面生长;
Compared with the behaviors of Pt nanoparticles-assisted etching of heavily doped P-type monocrystalline silicon, significant differences can be obtained, which means doping levels can affect the etching properties of P-type monocrystalline silicon. 这与Pt纳米颗粒催化刻蚀重掺杂P型单晶硅的实验结果有很大的差别,表明了掺杂浓度会影响Pt颗粒对P型单晶硅的催化刻蚀特性。
In this thesis, p-type Porous Silicon was obtained by conventional electrochemical anodization. 本文采用传统的电化学阳极腐蚀法制备p型多孔硅。
It is of great scientific importance and practical value for investigation of a-Si: H/ c-Si heterojunction solar cells on p-type crystalline silicon. P型衬底a-Si:H/c-Si异质结太阳能电池具有重要的科学意义和应用价值。